Test apparatus having bidirectional differential i

专利名称：Test apparatus having bidirectional

differential interface

发明人：Shoji Kojima申请号：US12390292申请日：20090220公开号：US07952359B2公开日：20110531

专利附图：

摘要：First and second resistors are provided between a first input/output terminaland a power supply terminal, and between a second input/output terminal and the powersupply terminal, respectively. Third and fourth resistors are connected to the second and

first input/output terminals, respectively. First and second current-switching switchescouple either the first input/output terminal side or the second input/output terminalside with a first current source and a second current source, respectively, according tothe value of pattern data. A level shift circuit shifts the electric potentials at the secondterminals of the third and forth resistors by a predetermined level. A comparator circuitcompares the electric potentials at the second terminals of the third and fourth resistorslevel-shifted by the level shift circuit with those at the second terminals of the fourth andthird resistors, respectively, and generates first and second comparison signals accordingto the comparison results.

申请人：Shoji Kojima

地址：Tokyo JP

国籍：JP

代理机构：Martine Penilla & Gencarella, LLP

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