PCI-X bus system testing and verification apparatu

专利名称：PCI-X bus system testing and verification

apparatus and method

发明人：Adam Browen申请号：US09795770申请日：20010228公开号：US06633832B1公开日：20031014

专利附图：

摘要：An improved PCI-X verification method and apparatus provides iterative testingof all desired conditions or protocol combinations in a PCI-X system. One or morecommands may be tested in combination with one or more functional behavior

parameters throughout a desired range of variable parameter values. In one aspect, anapparatus and method for testing a PCI-X device for compliance under the PCI-XAddendum to the PCI Local Bus Specification in completer operation are provided. Inanother aspect, an apparatus and method for testing a PCI-X-device for complianceunder the PCI-X addendum to the PCI Local Bus Specification in requester operation areprovided.

申请人：LSI LOGIC CORPORATION

代理机构：Suiter West PC LLO

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