专利名称：Temperature measurement device发明人：Giere, Matthew D.,Prakash, Satya,Barbour,
Michael J.
申请号：EP05075127.0申请日：20021010公开号：EP1547779A1公开日：20050629
专利附图：
摘要：An apparatus includes a substrate (300) and a resistive element (310) attachedto a region of the substrate (300) and formed of a first material (402, 500) having a firsttemperature coefficient of resistivity. In addition, the apparatus includes a pair of traces
(326) coupled to the resistive element (310), attached to the substrate (300), and formedof a second material (404, 502) having a second temperature coefficient of resistivity withthe first material (402, 500) selected so that the first temperature coefficient of resistivityexceeds the second temperature coefficient of resistivity. An apparatus includes asubstrate (300) and a resistive element (310) disposed onto a first region of the substrate(300) and formed of a first material (402, 500) having a first temperature coefficient ofresistivity. In addition, the apparatus includes a pair of traces (326) coupled to theresistive element (310) and each formed of a first plurality of sections (Fig. 5A, Fig. 5B) ofa second material (404, 502) having a second temperature coefficient of resistivity and asecond plurality of sections (Fig. 5A, Fig. 5B) of a third material having a third temperaturecoefficient of resistivity.
申请人：Hewlett-Packard Company
地址：3000 Hanover Street Palo Alto, CA 94304 US
国籍：US
代理机构：Jackson, Richard Eric
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