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74F132 Quad 2-Input NAND Schmitt TriggerMay 200774F132Quad 2-Input NAND Schmitt TriggerGeneral DescriptionThe F132 contains four 2-input NAND gates whichaccept standard TTL input signals and provide standardTTL output levels. They are capable of transformingslowly changing input signals into sharply defined, jitter-free output signals. In addition, they have a greater noisemargin than conventional NAND gates.Each circuit contains a 2-input Schmitt Trigger followedby level shifting circuitry and a standard FAST outputstructure. The Schmitt Trigger uses positive feedback toeffectively speed-up slow input transitions, and providedifferent input threshold voltages for positive andnegative-going transitions. This hysteresis between thepositive-going and negative-going input threshold (typi-cally 800mV) is determined by resistor ratios and isessentially insensitive to temperature and supply voltagevariations.tmOrdering InformationOrder Number74F132SC 74F132SJ Package NumberM14AM14DPackage Description14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150\" Narrow14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm WideDevices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering number.Connection DiagramLogic SymbolIEEE/IECUnit Loading/Fan Out Pin U.L.Input IIH/IIL, NamesDescriptionHIGH/LOWOutput IOH/IOLAn, BnOnInputsOutputs1.0 / 1.050 / 33.320µA / –0.6mA–1mA / 20mAFunction TableInputsALLHHOutputsBLHLHOHHHLH = HIGH Voltage LevelFAST® is a registered trademark of Fairchild Semiconductor Corporation.©1988 Fairchild Semiconductor Corporation74F132 Rev. 1.3

L = LOW Voltage Levelwww.fairchildsemi.com

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74F132 Quad 2-Input NAND Schmitt TriggerAbsolute Maximum Ratings

Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be

operable above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum ratings are stress ratings only.

Symbol Parameter TSTGTATJVCCVINIINVO

Storage Temperature

Ambient Temperature Under BiasJunction Temperature Under BiasVCC Pin Potential to Ground PinInput Voltage(1)Input Current(1)Voltage Applied to Output in HIGH State (with VCC = 0V)Standard Output3-STATE Output

Current Applied to Output in LOW State (Max.)ESD Last Passing Voltage (Min.)

Note:

1.Either voltage limit or current limit is sufficient to protect inputs.

Rating

–65°C to +150°C–55°C to +125°C–55°C to +150°C–0.5V to +7.0V–0.5V to +7.0V–30mA to +5.0mA

–0.5V to VCC–0.5V to 5.5V

twice the rated IOL (mA)

4000V

Recommended Operating Conditions

The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend exceeding them or designing to absolute maximum ratings.

Symbol Parameter TAVCC

Free Air Ambient TemperatureSupply Voltage

Rating

0°C to +70°C+4.5V to +5.5V

©1988 Fairchild Semiconductor Corporation

74F132 Rev. 1.3

www.fairchildsemi.com

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元器件交易网www.cecb2b.com

74F132 Quad 2-Input NAND Schmitt TriggerDC Electrical Characteristics

Symbol

VT+VT–∆VTVCDVOHVOLIIHIBVIICEXVIDIODIILIOSICCHICCL

Parameter

Positive-going ThresholdNegative-going ThresholdHysteresis (VT+ – VT–)Input Clamp Diode VoltageOutput HIGH Voltage10% VCC

5% VCC

Output LOW VoltageInput HIGH Current

Input HIGH Current Breakdown Test

Output HIGH Leakage CurrentInput Leakage Test

Output Leakage Circuit CurrentInput LOW Current

Output Short-Circuit CurrentPower Supply CurrentPower Supply Current

10% VCC

VCC

5.05.05.0Min.Min.Min.Max.Max.Max.0.00.0MaxMaxMaxMax

ConditionsMin.

1.50.70.4

Typ.Max.

2.01.1–1.2

Units

VVVVV

IIN = –18mAIOH = –1mAIOH = –1mAIOL = 20mAVIN = 2.7VVIN = 7.0VVOUT = VCC

IID = 1.9µA, All Other Pins Grounded

VIOD = 150mV, All Other Pins GroundedVIN = 0.5VVOUT = 0VVO = HIGHVO = LOW

–604.752.52.7

0.55.07.050

VµAµAµAV

3.75–0.6–15017.018.0

µAmAmAmAmA

AC Electrical Characteristics

TA = +25°C,VCC = +5.0V,CL = 50pF

Symbol

tPLHtPHL

TA = 0°C to +70°C,VCC = +5.0V,CL = 50pFMin.

3.55.0

Parameter

Propagation Delay, An, Bn to On

Min.

4.05.0

Typ.Max.

10.512.5

Max.

12.013.0

Units

ns

©1988 Fairchild Semiconductor Corporation74F132 Rev. 1.3

www.fairchildsemi.com

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元器件交易网www.cecb2b.com

74F132 Quad 2-Input NAND Schmitt TriggerPhysical DimensionsDimensions are in millimeters unless otherwise noted.Figure 1. 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150\" NarrowPackage Number M14A©1988 Fairchild Semiconductor Corporation74F132 Rev. 1.3

www.fairchildsemi.com

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元器件交易网www.cecb2b.com

74F132 Quad 2-Input NAND Schmitt TriggerPhysical Dimensions (Continued) Dimensions are in millimeters unless otherwise noted.Figure 2. 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm WidePackage Number M14D©1988 Fairchild Semiconductor Corporation74F132 Rev. 1.3

www.fairchildsemi.com

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元器件交易网www.cecb2b.com

74F132 Quad 2-Input NAND Schmitt TriggerTRADEMARKSThefollowingareregisteredandunregisteredtrademarksFairchildSemiconductorownsorisauthorizedtouseandisnotintendedtobeanexhaustivelistofallsuchtrademarks.ACExAcrosstheboard.Aroundtheworld.™ActiveArray™Bottomless™BuilditNow™CoolFET™CROSSVOLT™CTL™CurrentTransferLogic™DOME™2ECMOS™®EcoSPARKEnSigna™FACTQuietSeries™®FACT®FASTFASTr™FPS™®FRFETGlobalOptoisolator™GTO™HiSeC™®i-Lo™ImpliedDisconnect™IntelliMAX™ISOPLANAR™MICROCOUPLER™MicroPak™MICROWIRE™Motion-SPM™MSX™MSXPro™OCX™OCXPro™®OPTOLOGIC®OPTOPLANARPACMAN™PDP-SPM™POP™®Power220®Power247PowerEdge™PowerSaver™Power-SPM™®PowerTrenchProgrammableActiveDroop™®QFETQS™QTOptoelectronics™QuietSeries™RapidConfigure™RapidConnect™ScalarPump™SMARTSTART™®SPMSTEALTH™SuperFET™SuperSOT™-3SuperSOT™-6SuperSOT™-8SyncFET™TCM™®ThePowerFranchise™TinyBoost™TinyBuck™®TinyLogicTINYOPTO™TinyPower™TinyWire™TruTranslation™µSerDes™®UHCUniFET™VCX™Wire™DISCLAIMERFAIRCHILDSEMICONDUCTORRESERVESTHERIGHTTOMAKECHANGESWITHOUTFURTHERNOTICETOANYPRODUCTSHEREINTOIMPROVERELIABILITY,FUNCTIONORDESIGN.FAIRCHILDDOESNOTASSUMEANYLIABILITYARISINGOUTOFTHEAPPLICATIONORUSEOFANYPRODUCTORCIRCUITDESCRIBEDHEREIN;NEITHERDOESITCONVEYANYLICENSEUNDERITSPATENTRIGHTS,NORTHERIGHTSOFOTHERS.THESESPECIFICATIONSDONOTEXPANDTHETERMSOFFAIRCHILD’SWORLDWIDETERMSANDCONDITIONS,SPECIFICALLYTHEWARRANTYTHEREIN,WHICHCOVERSTHESEPRODUCTS.LIFESUPPORTPOLICYFAIRCHILD’SPRODUCTSARENOTAUTHORIZEDFORUSEASCRITICALCOMPONENTSINLIFESUPPORTDEVICESORSYSTEMSWITHOUTTHEEXPRESSWRITTENAPPROVALOFFAIRCHILDSEMICONDUCTORCORPORATION.Asusedherein:1.Lifesupportdevicesorsystemsaredevicesorsystemswhich,(a)areintendedforsurgicalimplantintothebodyor(b)supportorsustainlife,and(c)whosefailuretoperformwhenproperlyusedinaccordancewithinstructionsforuseprovidedinthelabeling,canbereasonablyexpectedtoresultinasignificantinjuryoftheuser.PRODUCTSTATUSDEFINITIONSDefinitionofTermsDatasheetIdentificationAdvanceInformationPreliminaryProductStatusFormativeorInDesignFirstProductionDefinitionThisdatasheetcontainsthedesignspecificationsforproductdevelopment.Specificationsmaychangeinanymannerwithoutnotice.Thisdatasheetcontainspreliminarydata;supplementarydatawillbepublishedatalaterdate.FairchildSemiconductorreservestherighttomakechangesatanytimewithoutnoticetoimprovedesign.Thisdatasheetcontainsfinalspecifications.FairchildSemiconductorreservestherighttomakechangesatanytimewithoutnoticetoimprovedesign.ThisdatasheetcontainsspecificationsonaproductthathasbeendiscontinuedbyFairchildSemiconductor.Thedatasheetisprintedforreferenceinformationonly.Rev.I262.Acriticalcomponentinanycomponentofalifesupport,device,orsystemwhosefailuretoperformcanbereasonablyexpectedtocausethefailureofthelifesupportdeviceorsystem,ortoaffectitssafetyoreffectiveness.NoIdentificationNeededFullProductionObsoleteNotInProduction©1988 Fairchild Semiconductor Corporation74F132 Rev. 1.3

www.fairchildsemi.com

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