专利名称：Robust detection of strain with temperature
correction
发明人：Larry M. Oberdier,Thaddeus
Schroeder,Robert J. Disser,Tina M.Dewar,Thomas A. Baudendistel,BrunoLequesne,Donald T. Morelli
申请号：US11256483申请日：20051021
公开号：US20070096724A1公开日：20070503
专利附图：
摘要：An apparatus () is set forth for measuring a return signal of a magnetostrictivesensor () that detects a force, torque, or pressure. The return signal includes noise, a DCresistance (), an AC resistance and an inductance and the inductance is shifted ninetydegrees from the AC resistance. The apparatus () includes a sensor filter () to remove thenoise from the return signal. A sensor filter () shifts the return signal and more
specifically, the inductance by an additional angle and the sum of the additional angle andthe ninety degrees phase shift is defined as the final detection angle. To detect theinductance at the final detection angle, a wave filter () and a reference filter () shifts areference signal by the final detection angle to trigger a first demodulator () to detectthe inductance at the final detection angle. The inductance detected by the firstdemodulator () varies due to temperature. To remove the temperature from themeasured inductance, the apparatus includes a DC detection circuit () to detect the DCresistance which is proportional to the temperature across the sensor (). The DC
resistance and the measure inductance are inserted into a correction equation to producea corrected inductance which is independent of temperature. Instead of inductance, an ACresistance may be used in the equation.
申请人：Larry M. Oberdier,Thaddeus Schroeder,Robert J. Disser,Tina M. Dewar,ThomasA. Baudendistel,Bruno Lequesne,Donald T. Morelli
地址：Royal Oak MI US,Rochester Hills MI US,Dayton OH US,Dayton OHUS,Farmersville OH US,Troy MI US,White Lake MI US
国籍：US,US,US,US,US,US,US
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