专利名称：VISUAL INSPECTION SYSTEM发明人：Moon J. Kim,Yumi Mori,Hiroki
Nakano,Masakuni Okada
申请号：US12057942申请日：20080328
公开号：US20090245615A1公开日：20091001
专利附图：
摘要：This solution relates to machine vision computing environments, and morespecifically relates to a system and method for selectively accelerating the execution ofimage processing applications using a cell computing system. The invention provides a
high performance machine vision system over the prior art and provides a method forexecuting image processing applications on a Cell and BPE3 image processing system.Moreover, implementations of the invention provide a machine vision system and methodfor distributing and managing the execution of image processing applications at a fine-grained level via a PCIe connected system. The hybrid system is replaced with the BPE3and the switch is also eliminated from the prior in order to meet over 1 GB processingrequirement.
申请人：Moon J. Kim,Yumi Mori,Hiroki Nakano,Masakuni Okada
地址：Wappingers Falls NY US,Yamato-shi JP,Otsu JP,Atsugi-shi JP
国籍：US,JP,JP,JP
更多信息请下载全文后查看
因篇幅问题不能全部显示，请点此查看更多更全内容