专利名称：Apparatus and method for evaluating
statistical interference concerning multi-source noise environment ofelectromagnetic zone
发明人：Su Na Choi,Seung Keun Park申请号：US13911501申请日：20130606公开号：US09214971B2公开日：20151215
专利附图：
摘要：An apparatus and method for evaluating statistical interference concerning a
multi-source noise environment of an electromagnetic (EM) zone are disclosed. Theapparatus for evaluating statistical interference may include a receiver to receive an EMwave in a preset frequency band, a spectrum analyzer to analyze the received EM waveand to measure interference in the preset frequency band, a frequency selector to selectan interest frequency in the frequency band based on a level of the measured
interference, an amplitude probability distribution (APD) measurement unit to measurean APD of an interference signal with respect to the interest frequency, and a comparatorto compare the measured APD to a preset limit and to draw a probability of the limit orhigher of interference occurring.
申请人：Electronics and Telecommunications Research Institute
地址：Daejeon KR
国籍：KR
代理机构：Nelson Mullins Riley & Scarborough LLP
代理人：Anthony A. Laurentano, Esq.,Michael Malone, Esq.
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